| BS 4727-1:Group 08:1992* IEC 60050-561:1991 | Glossary of electrotechnical, power, telecommunication, electronics, lighting and colour terms. Terms common to power, telecommunications and electronics. Piezoelectric devices for frequency control and selection |
| BS 4727-3:Group 14:1992* IEC 60050-702:1992 | Glossary of electrotechnical, power, telecommunication, electronics, lighting and colour terms. Terms particular to telecommunications and electronics. Oscillations, signals and related devices |
| BS 5069-1:1980* IEC 60122-3:1977* IEC 60122-3A:1979 | Dimensions of piezoelectric devices. Specification for standard outlines and pin connections for quartz crystal units |
| BS 5069-2:1983* IEC 60368-3:1979* IEC 60368-3A:1981 | Dimensions of piezoelectric devices. Specification for standard outlines for piezoelectric filters |
| BS 9600:1983 | Specification for piezoelectric crystal filters of assessed quality: generic data and methods of test |
| BS 9602:1984 | Blank detail specification for quartz crystal filters of assessed quality: full assessment level |
| BS 9610:1982 | Specification for quartz crystal units of assessed quality: generic data and methods of test |
| BS 9611 N004:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, BF, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9611 N005:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9611 N006:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX, BF and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non- temperature controlled). Full assessment level |
| BS 9611 N007:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9611 N008:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9611 N009:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N004:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N005:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N006:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N007:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N008:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N009:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N010:1979 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N016:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N017:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N018:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N019:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N020:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N021:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9617:1982 | Rules for the preparation of detail specifications for quartz crystal units of assessed quality. Full assessment level |
| BS 9618:1988 | Specification for capability approval of quartz crystal units: generic data |
| BS 9620:1975 | Specification for quartz crystal oscillators of assessed quality: generic data and methods of test |
| BS 9625:1983 | Blank detail specification for quartz crystal oscillators of assessed quality: full assessment level |
| BS CECC 68100:1991 | Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
| BS EN 167000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: piezoelectric filters |
| BS EN 167100:1996 | Harmonized system of quality assessment for electronic components. Section specification: piezoelectric filters (Capability approval) |
| BS EN 167101:1996 | Harmonized system of quality assessment for electronic components. Blank detail specification:piezoelectric filters (Capability approval) |
| BS EN 168000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
| BS EN 168100:1995 | Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
| BS EN 168101:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
| BS EN 168200:1996 | Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval) |
| BS EN 168201:1996 | Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
| BS EN 169000:1993 | Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
| BS EN 169100:1993 | Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval) |
| BS EN 169101:1995 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval) |
| BS EN 169200:1996 | Harmonized system of quality assessment for electronic components. Sectional specification: Quartz crystal controlled oscillators (qualification approval) |
| BS EN 169201:1996 | Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal controlled oscillators (Qualification approval) |
| BS EN 170000:1999 | Harmonized system of quality assessment for electronic components. Generic specification: waveguide type dielectric resonators |
| BS EN 170100:2001 | Harmonized system of quality assessment for electronic components. Sectional specification: Waveguide type dielectric resonators |
| BS EN 170101:2001 | Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval |
| BS EN 171000:2001 | Harmonized system of quality assessment for electronic components. Generic specification. Filters using waveguide type dielectric resonators |
| BS EN 50324-1:2002 | Piezoelectric properties of ceramic materials and components. Terms and definitions |
| BS EN 50324-2:2002 | Piezoelectric properties of ceramic materials and components. Methods of measurement. Low power |
| BS EN 50324-3:2002 | Piezoelectric properties of ceramic materials and components. Methods of measurement. High power |
| BS EN 60122-1:2002 | Quartz crystal units of assessed quality. Generic specification |
| BS EN 60122-3:2001 | Quartz crystal units of assessed quality. Standard outlines and lead connections |
| BS EN 60368-1:2000* IEC 60368-1:2000 | Piezoelectric filters. Generic specification |
| BS EN 60368-2-2:1999* IEC 60368-2-2:1996 | Piezoelectric filters. Guide to the use of piezoelectric filters. Piezoelectric ceramic filters. Section 2: Piezoelectric ceramic filters |
| BS EN 60368-3:2002* IEC 60368-3:2001 | Piezoelectric filters. Standard outlines and lead connections |
| BS EN 60368-4-1:2001* IEC 60368-4-1:2000 | Piezoelectric filters. Blank detail specification. Capability approval |
| BS EN 60368-4:2001* IEC 60368-4:2000 | Piezoelectric filters. Sectional specification. Capability approval |
| BS EN 60444-1:1997* IEC 60444-1:1986 | Measurement of quartz crystal unit parameters. Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network |
| BS EN 60444-2:1997* IEC 60444-2:1980 | Measurement of quartz crystal unit parameters. Phase offset method for measurement of motional capacitance of quartz crystal units |
| BS EN 60444-3:1997* IEC 60444-3:1986 | Measurement of quartz crystal unit parameters. Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C0 |
| BS EN 60444-4:1997* IEC 60444-4:1988 | Measurement of quartz crystal unit parameters. Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| BS EN 60444-5:1997* IEC 60444-5:1995 | Measurement of quartz crystal unit parameters. Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| BS EN 60444-6:1997* IEC 60444-6:1995 | Measurement of quartz crystal unit parameters. Measurement of drive level dependence (DLD) |
| BS EN 60444-7:2004 | Measurement of quartz crystal unit parameters. Measurement of activity and frequency dips of quartz crystal units |
| BS EN 60444-8:2003 | Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units |
| BS EN 60444-9:2007 | Measurement of quartz crystal unit parameters. Measurement of spurious resonances of piezoelectric crystal units |
| BS EN 60679-1:1998* IEC 60679-1:1997 | Quartz crystal controlled oscillators of assessed quality. Generic specification |
| BS EN 60679-1:2007 | Quartz crystal controlled oscillators of assessed quality. Generic specification |
| BS EN 60679-3:2002* IEC 60679-3:2001 | Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections |
| BS EN 60679-4-1:1998* IEC 60679-4-1:1998 | Quartz crystal controlled oscillators of assessed quality. Blank detail specification. Capability approval |
| BS EN 60679-4:1998* IEC 60679-4:1997 | Quartz crystal controlled oscillators of assessed quality. Sectional specification. Capability approval |
| BS EN 60679-5-1:1998* IEC 60679-5-1:1998 | Quartz crystal controlled oscillators of assessed quality. Blank detail specification. Qualification approval |
| BS EN 60679-5:1998* IEC 60679-5:1998 | Quartz crystal controlled oscillators of assessed quality. Sectional specification. Qualification approval |
| BS EN 60758:2005 | Synthetic quartz crystal. Specifications and guide to the use |
| BS EN 60862-1:2003 | Surface acoustic wave (SAW) filters of assessed quality. Generic specification |
| BS EN 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality. Standard outlines |
| BS EN 61019-1:2005 | Surface acoustic wave (SAW) resonators. Generic specification |
| BS EN 61019-2:1997* IEC 61019-2:1995 | Surface acoustic wave (SAW) resonators. Guide to the use |
| BS EN 61019-2:2005 | Surface acoustic wave (SAW) resonators. Guide to the use |
| BS EN 61240:1997* IEC 61240:1994 | Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules |
| BS EN 61337-1-1:1998* IEC 61337-1-1:1995 | Filters using waveguide type dielectric resonators. General information, standard values and test conditions. General information and standard values |
| BS EN 61337-1:2004 | Filters using waveguide type dielectric resonators. Generic specification |
| BS EN 61337-2:2004 | Filters using waveguide type dielectric resonators. Guide for use |
| BS EN 61338-1-3:2000* IEC 61338-1-3:1999 | Waveguide type dielectric resonators. General information and test conditions. Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency |
| BS EN 61338-1-4:2006 | Waveguide type dielectric resonators. General information and test conditions. Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency |
| BS EN 61338-1:2005 | Waveguide type dielectric resonators. Generic specification |
| BS EN 61338-2:2004 | Waveguide type dielectric resonators. Guidelines for oscillator and filter applications |
| BS EN 61338-4-1:2005 | Waveguide type dielectric resonators. Blank detail specification |
| BS EN 61338-4:2005 | Waveguide type dielectric resonators. Sectional specification |
| BS EN 61837-1:1999* IEC 61837-1:1999 | Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Plastic moulded enclosure outlines |
| BS EN 61837-2:2001 | Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures |
| BS EN 61837-3:2001* IEC 61837-3:2000 | Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Metal enclosures |
| BS EN 61837-4:2004 | Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Hybrid enclosure outlines |
| BS EN 62276:2005 | Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods |
| DD IEC TS 61994-1:2003 | Piezoelectric and dielectric devices for frequency control and selection. Glossary. Piezoelectric and dielectric resonators |
| DD IEC TS 61994-4-2:2003 | Piezoelectric and dielectric devices for frequency control and selection. Glossary. Piezoelectric and dielectric materials. Piezoelectric ceramics |
| DD IEC/PAS 60679-6:2008 | Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide |
| DD IEC/TS 61994-4-1:2007 | Piezoelectric and dielectric devices for frequency control and selection. Glossary. Piezoelectric materials. Synthetic quartz crystal |
| DD IEC/TS 61994-4-3:2008 | Piezoelectric and dielectric devices for frequency control and selection. Glossary. Materials. Materials for dielectric devices |
| PD IEC/PAS 62276:2002 | Single crystal wafers applied for surface acoustic wave device. Specification and measuring method |
| PD IEC/PAS 62277:2002* IEC/PAS 62277:2001 | Test-fixture of surface mounting quartz crystal units |
