IHS Logo IHS - The Source for Critical Information and Insight BSi Logo
British Standards Online Heading
How to subscribe to British Standards Online
  Need a quote from IHS?
  The British Standards Online service is available via subscription from IHS. To speak to an expert about this service, please call:
+44 (0)1344 328300 or complete the
form below

Request an IHS quote for
British Standards Online
 
IHS Logo

BSi Logo
The following lists the key subject areas for this British Standards module.
Click the links to view the associated British Standards for each area.

Home >
Electromechanical components ( Module 22 ) >

Integrated circuits. Microelectronics , Electromechanical components ( Module 22 )
BS 3363:1980* IEC 60148:1969Specification for letter symbols for semiconductor devices and integrated microcircuits
BS 3363:Supplement No. 1:1981* IEC 60148A:1974 Specification for letter symbols for semiconductor devices and integrated microcircuits
BS 3363:Supplement No. 2:1981* IEC 60148B:1979 Specification for letter symbols for semiconductor devices and integrated microcircuits
BS 6493-2.1:1985* IEC 60748-1:1984Semiconductor devices. Integrated circuits. General
BS 6493-2.3:1987* IEC 60748-3:1986Semiconductor devices. Integrated circuits. Recommendations for analogue integrated circuits
BS 6493-3:1985* IEC 60749:1984Semiconductor devices. Mechanical and climatic test methods
BS 6493:Part 2:Section 2.2:1986* IEC 60748-2:1985 Semiconductor devices. Integrated circuits. Recommendations for digital integrated circuits
BS 6493:Part 2:Section 2.4:1989* IEC 60748-4:1987 Semiconductor devices. Integrated circuits. Recommendations for interface integrated circuits
BS 7240:1990* IEC 60828:1988Pin allocations for microprocessor systems using the IEC 603-2 connector
BS 9400:1970Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test
BS 9430:1978Rules for the preparation of detail specifications for integrated circuits of assessed quality: voltage regulators. Full assessment level
BS 9450:1975Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test
BS 9450:1998Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test
BS 9460:1974Rules for the preparation of detail specifications for integrated circuits of assessed quality: differential operational amplifiers. General application category
BS 9490:1975Rules for the preparation of detail specifications for digital integrated circuits of assessed quality. Full assessment level
BS 9491:1975Rules for the preparation of detail specifications for analogue integrated circuits of assessed quality. Full assessment level
BS 9492:1978Rules for the preparation of detail specifications for capacitively coupled digital integrated circuits of assessed quality. Full assessment level
BS 9493:1981Rules for the preparation of detail specifications for integrated circuits of assessed quality which perform mixed digital and/or analogue functions
BS CECC 00013:1985Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
BS CECC 63000:1990Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
BS CECC 63100:1985Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
BS CECC 63101:1985Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
BS CECC 63200:1985Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits (capability approval)
BS CECC 63201:1985Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval)
BS CECC 90000:1985Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS CECC 90000:1991Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS CECC 90000:Addendum No. 1:1983Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection
BS CECC 90101:1980Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84
BS CECC 90102:1980Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S
BS CECC 90103:1980Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
BS CECC 90103:1983Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
BS CECC 90104:1981Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB
BS CECC 90104:1990Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB
BS CECC 90105:1987Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits
BS CECC 90109:1986Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU
BS CECC 90111:1987Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits
BS CECC 90112:1987Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
BS CECC 90113:1987Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits
BS CECC 90114:1990Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA)
BS CECC 90115:1994Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
BS CECC 90200:1988Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits
BS CECC 90203:1985Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits
BS CECC 90300:1988Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
BS CECC 90301:1985Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers
BS EN 165000-1:1996Film and hybrid integrated circuits. Generic specification Capability approval procedure
BS EN 165000-2:1996Film and hybrid integrated circuits. Internal visual inspection and special tests
BS EN 165000-3:1996Film and hybrid integrated circuits. Self-audit checklist and report for film and hybrid integrated circuit manufacturers
BS EN 165000-4:1996Film and hybrid integrated circuits. Customer information, product assessment level schedules and blank detail specification
BS EN 165000-5:1998Film and hybrid integrated circuits. Procedure for qualification approval
BS EN 190000:1996Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS EN 190100:1993Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
BS EN 190101:1994Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
BS EN 190102:1994Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S
BS EN 190103:1994Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS
BS EN 190106:1994Specification for harmonized system of quality assessment for electronic components. Family specification. TTL advanced low power SCHOTTKY digital integrated circuits series 54 ALS, 74 ALS
BS EN 190107:1994Specification for harmonized system of quality assessment for electronic components. Family specification. TTL FAST digital integrated circuits series 54 F, 74 F
BS EN 190108:1994Specification for harmonized system of quality assessment for electronic components. Family specification. TTL advanced SCHOTTKY digital integrated circuits series 54 AS, 74 AS
BS EN 190109:1994Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated HC MOS circuits series HC/HCT/HCU
BS EN 190110:1994Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits
BS EN 190116:1994Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits
BS EN 60747-16-10:2004Semiconductor devices. Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
BS EN 60747-16-1:2002+A1:2007Semiconductor devices. Microwave integrated circuits. Amplifiers
BS EN 61523-1:2002* IEC 61523-1:2001Delay and power calculation standards. Integrated circuit delay and power calculation systems
BS EN 61523-2:2002Delay and power calculation standards. Pre-layout delay calculation specification for CMOS ASIC libraries
BS EN 61943:1999* IEC 61943:1999* QC 211001:1999Integrated circuits. Manufacturing line approval application guideline
BS EN 61964:1999* IEC 61964:1999Integrated circuits. Memory devices pin configurations
BS EN 61967-1:2002* IEC 61967-1:2002Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. General conditions and definitions
BS EN 61967-2:2005Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of radiated emissions. TEM cell and wideband TEM cell method
BS EN 61967-4:2002Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. 1 ohm/150 ohm direct coupling method
BS EN 61967-5:2003Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. Workbench Faraday Cage method
BS EN 61967-6:2002+A1:2008Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. Magnetic probe method
BS EN 62090:2003Product package labels for electronic components using bar code and two-dimensional symbologies
BS EN 62132-1:2006Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz. General conditions and definitions
BS EN 62132-3:2007Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz. Bulk current injection (BCI) method
BS EN 62132-4:2006Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz. Direct RF power injection method
BS EN 62132-5:2006Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz. Workbench Faraday cage method
BS IEC 60747-4-1:2000* QC 750115:2000Microwave diodes and transistors. Microwave field effect transistors. Blank detail specification. BDS for microwave field-effect transistors
BS IEC 60747-4-2:2000* QC 750116:2000Semiconductor devices. Discrete devices. Microwave diodes and transistors. Integrated-circuit microwave amplifiers. Blank detail specification
BS IEC 60748-11:2000* QC 790100:1990Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-1:2002Semiconductor devices. Integrated circuits. General
BS IEC 60748-2-11:1999Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory. Blank detail specification for single supply integrated circuits electrically erasible and programmable read-only memory
BS IEC 60748-2-12:2001* QC 790121:2001Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification for programmable logic devices (PLDs)
BS IEC 60748-2-20:2000Semiconductor devices. Integrated circuits. Digital integrated circuits. Family specification. Low voltage integrated circuits
BS IEC 60748-2-20:2008Semiconductor devices. Integrated circuits. Digital integrated circuits. Family specification. Low voltage integrated circuits
BS IEC 60748-23-1:2002Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Generic specification
BS IEC 60748-23-2:2002Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Internal visual inspection and special tests
BS IEC 60748-23-3:2002Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Manufacturers' self-audit checklist and report
BS IEC 60748-23-4:2002Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Blank detail specification
BS IEC 60748-23-5:2003Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Procedure for qualification approval
BS IEC 60748-2:1997Semiconductor devices. Integrated circuits. Digital integrated circuits
BS IEC 60748-4-3:2006Semiconductor devices. Integrated circuits. Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
BS IEC 60748-4:1997Semiconductor devices. Integrated circuits. Interface integrated circuits
BS IEC 60748-5:1997Semiconductor devices. Integrated circuits. Semicustom integrated circuits
BS IEC 62265:2005Advanced library format (ALF) describing integrated circuit (IC) technology, cells and blocks
BS IEC 62528:2007Standard testability method for embedded core-based integrated circuits
BS ISO/IEC 14443-1:2000Identification cards. Contactless integrated circuit(s) cards. Proximity cards. Physical characteristics
BS QC 700000:1991* IEC 60747-10:1991Harmonized system of quality assessment for electric components. Generic specification for discrete devices and integrated circuits
BS QC 760000:1990* IEC 60748-20:1988Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
BS QC 760001:1994* IEC 60748-20-1:1994Harmonized system of quality assessment for electronic components. Film and hybrid integrated circuits. Generic specification. Requirements for internal visual inspection
BS QC 760100:1991* IEC 60748-21:1991Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film and hybrid integrated circuits: qualification approval
BS QC 760100:1997* IEC 60748-21:1997Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
BS QC 760101:1992Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Film and hybrid integrated circuits: qualification approval procedure
BS QC 760101:1997* IEC 60748-21-1:1997Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
BS QC 760200:1992* IEC 60748-22:1992Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits: capability approval
BS QC 760200:1997* IEC 60748-22:1997Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
BS QC 760201:1992* IEC 60748-22-1:1991Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Film and hybrid integrated circuits: capability approval
BS QC 760201:1997* IEC 60748-22-1:1997Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
BS QC 790101:1992* IEC 60748-11-1:1992Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
BS QC 790104:1992Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
BS QC 790105:1993* IEC 60748-2-7:1992Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories
BS QC 790106:1995* IEC 60748-2-9:1994Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. MOS ultraviolet light erasable electrically programmable read-only memories
BS QC 790107:1995* IEC 60748-2-10:1994Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories
BS QC 790109:1992Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU
BS QC 790110:1992Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Microprocessor integrated circuits
BS QC 790111:1993* IEC 60748-2-8:1993Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories
BS QC 790130:1992Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
BS QC 790131:1992Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
BS QC 790132:1992Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
BS QC 790202:1991Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers
BS QC 790303:1994* IEC 60748-4-1:1993Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
BS QC 790304:1994* IEC 60748-4-2:1993Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
DD ENV 190000-6:1994Generic specification: monolithic integrated circuits. Procedure for approval and quality management
DD ENV 50218:1996Description of a parametrized European mini test chip
DD ENV 50219:1996Description of the reliability test structures of the European mini test chip
DD IEC/TS 61967-3:2005Integrated circuits. Measurement of electromagnetic emissions, 150 kHzto 1 GHz. Measurement of radiated emissions. Surface scan method
DD IEC/TS 62215-2:2007Integrated circuits. Measurement of impulse immunity. Synchronous transient injection method
DD IEC/TS 62228:2007Integrated circuits. EMC evaluation of CAN transceivers
DD IEC/TS 62404:2007Logic digital integrated circuits. Specification for I/O interface model for integrated circuit (IMIC version 1.3)
PD 6595:1996* CENELEC Report R117-006:1995Parameter extraction techniques for the European mini test chip
PD 6598:1996* CENELEC Report R117-005:1995Measurement techniques for the characterization of the European mini test chip
PD 6601:1996* CENELEC Report R117-004:1995JESSI 0.8 mum CMOS transistor model for analogue and digital circuit simulation
PD IEC/TR 61352:2006Mnemonics and symbols for integrated circuits
PD IEC/TR 61967-4-1:2005Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4
IHS experience – your advantage

IHS, formerly known as Technical Indexes, is one of the foremost providers of standards, regulatory, product and supplier information to industries worldwide including construction, health & safety, engineering, education, rail, energy, automotive, defence and many more. With over 45 years experience and more than 6000 customers based in the UK alone, IHS is the only company of its type providing access to several million pages of vital information.

The British Standard Service provided by IHS focuses on supplying you an established, authoritative, reliable and comprehensive information source.

How to subscribe to British Standards Online